Share Email Print

Proceedings Paper

Laboratory measurements of hot iron opacities at EUV wavelengths
Author(s): E. Wagenaars; L. M. R. Gartside; A. K. Rossall; N. Booth; S. White; C. L. S. Lewis; M. M. Notley; R. Heathcote; G. J. Tallents
Format Member Price Non-Member Price
PDF $17.00 $21.00

Paper Abstract

The evolution of the transmission of extreme ultra-violet (EUV) light from a germanium backlighter through heated thin iron targets has been measured at laser irradiances of about 8×1016 W cm-2. A rapid increase in transmission from 0 to 30% in 20 ps was observed. A two dimensional radiation hydrodynamics model was used to simulate the heating of the plasma and the transmission of EUV light as a function of time. The tamped iron targets were heated up to an average electron temperature of about 55 eV and a mass density of approximately 0.6 g cm-3. The transmission measurements are in reasonable agreement with modelling results. The experimental layout is similar to an X-ray laser experiment and therefore, for relatively low plasma temperatures, these kinds of experiments can be done in combination with X-ray laser experiments, giving transmission data for a range of wavelengths rather than a single X-ray laser wavelength.

Paper Details

Date Published: 28 September 2009
PDF: 8 pages
Proc. SPIE 7451, Soft X-Ray Lasers and Applications VIII, 74510G (28 September 2009); doi: 10.1117/12.825057
Show Author Affiliations
E. Wagenaars, The Univ. of York (United Kingdom)
L. M. R. Gartside, The Univ. of York (United Kingdom)
A. K. Rossall, The Univ. of York (United Kingdom)
N. Booth, The Univ. of York (United Kingdom)
S. White, Queen's Univ. Belfast (United Kingdom)
C. L. S. Lewis, Queen's Univ. Belfast (United Kingdom)
M. M. Notley, Rutherford Appleton Lab. (United Kingdom)
R. Heathcote, Rutherford Appleton Lab. (United Kingdom)
G. J. Tallents, The Univ. of York (United Kingdom)

Published in SPIE Proceedings Vol. 7451:
Soft X-Ray Lasers and Applications VIII
James Dunn; Gregory J. Tallents, Editor(s)

© SPIE. Terms of Use
Back to Top