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Proceedings Paper

Scene-based nonuniformity correction algorithm for MEMS-based un-cooled IR image system
Author(s): Liquan Dong; Xiaohua Liu; Yuejin Zhao; Mei Hui; Xiaoxiao Zhou
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Paper Abstract

Almost two years after the investors in Sarcon Microsystems pulled the plug, the micro-cantilever array based uncooled IR detector technology is again attracting more and more attention because of its low cost and high credibility. An uncooled thermal detector array with low NETD is designed and fabricated using MEMS bimaterial microcantilever structures that bend in response to thermal change. The IR images of objects obtained by these FPAs are readout by an optical method. For the IR images, one of the most problems of FPN is complicated by the fact that the response of each FPA detector changes due to a variety of factors, causing the nonuniformity pattern to slowly drift in time. Thus, it is required to remove the nonuniformity. A scene-based nonuniformity correction algorithm was discussed in this paper, against to the traditional calibration-based and other scene-based techniques, which has the better correct performance; better MSE compared with traditional methods can be obtained. Great compute and analysis have been realized by using the discussed algorithm to the simulated data and real infrared scene data respectively. The experimental results demonstrate, the corrected image by this algorithm not only yields highest Peak Signal-to-Noise Ratio values (PSNR), but also achieves best visual quality.

Paper Details

Date Published: 27 August 2009
PDF: 12 pages
Proc. SPIE 7419, Infrared Systems and Photoelectronic Technology IV, 74190Y (27 August 2009); doi: 10.1117/12.825041
Show Author Affiliations
Liquan Dong, Beijing Institute of Technology (China)
Xiaohua Liu, Beijing Institute of Technology (China)
Yuejin Zhao, Beijing Institute of Technology (China)
Mei Hui, Beijing Institute of Technology (China)
Xiaoxiao Zhou, Beijing Institute of Technology (China)


Published in SPIE Proceedings Vol. 7419:
Infrared Systems and Photoelectronic Technology IV
Eustace L. Dereniak; Randolph E. Longshore; Ashok K. Sood; John P. Hartke; Paul D. LeVan, Editor(s)

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