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Proceedings Paper

NDE methods for determining the materials properties of silicon carbide plates
Author(s): Shant Kenderian; Yong Kim; Eric Johnson; Iwona A. Palusinski
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Paper Abstract

Two types of SiC plates, differing in their manufacturing processes, were interrogated using a variety of NDE techniques. The task of evaluating the materials properties of these plates was a challenge due to their non-uniform thickness. Ultrasound was used to estimate the Young's Modulus and calculate the thickness profile and Poisson's Ratio of the plates. The Young's Modulus profile plots were consistent with the thickness profile plots, indicating that the technique was highly influenced by the non-uniform thickness of the plates. The Poisson's Ratio is calculated from the longitudinal and shear wave velocities. Because the thickness is cancelled out, the result is dependent only on the time of flight of the two wave modes, which can be measured accurately. X-Ray was used to determine if any density variations were present in the plates. None were detected suggesting that the varying time of flight of the acoustic wave is attributed only to variations in the elastic constants and thickness profiles of the plates. Eddy Current was used to plot the conductivity profile. Surprisingly, the conductivity profile of one type of plates varied over a wide range rarely seen in other materials. The other type revealed a uniform conductivity profile.

Paper Details

Date Published: 22 August 2009
PDF: 11 pages
Proc. SPIE 7425, Optical Materials and Structures Technologies IV, 742507 (22 August 2009); doi: 10.1117/12.824885
Show Author Affiliations
Shant Kenderian, The Aerospace Corp. (United States)
Yong Kim, The Aerospace Corp. (United States)
Eric Johnson, The Aerospace Corp. (United States)
Iwona A. Palusinski, The Aerospace Corp. (United States)


Published in SPIE Proceedings Vol. 7425:
Optical Materials and Structures Technologies IV
Joseph L. Robichaud; William A. Goodman, Editor(s)

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