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Proceedings Paper

New microfocus source for x-ray diffractometry in the home-lab
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Paper Abstract

The increasing importance of X-ray diffractometry with one- and two-dimensional detectors for materials research has lead to a rising demand for highly intense X-ray sources enabling the analysis of very small and weakly scattering samples in the home-lab within a reasonable time frame. As a result, various microfocusing sealed tube X-ray sources with focal spot sizes below 50μm are now available. Potential applications of the low-maintenance, high-brilliance microfocus source IμS, which are equipped with different two-dimensional beam shaping multilayer optics, will be shown. With the instrumentation that is now available, more and more crucial measurements like gracing incidence small angle X-ray scattering or stress and pole figure measurements can be carried out in the lab, and even in-situ during dynamic processes. Some ideas on new instrumental set-ups for customized X-ray analytics will also be shown.

Paper Details

Date Published: 8 September 2009
PDF: 6 pages
Proc. SPIE 7448, Advances in X-Ray/EUV Optics and Components IV, 74480Q (8 September 2009); doi: 10.1117/12.824855
Show Author Affiliations
Bernd Hasse, Incoatec GmbH (Germany)
Jörg Wiesmann, Incoatec GmbH (Germany)
Carsten Michaelsen, Incoatec GmbH (Germany)


Published in SPIE Proceedings Vol. 7448:
Advances in X-Ray/EUV Optics and Components IV
Ali M. Khounsary; Christian Morawe; Shunji Goto, Editor(s)

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