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Proceedings Paper

CTE measurements of Cesic®: a low-CTE ceramic composite
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Paper Abstract

During the past several years, ECM carried out a large trade-off project with the objective of comparing CTEmeasurements of samples of our Cesic® MF ceramic material performed by laboratories in Europe, USA, and Japan. Our focus was on CTE measurements in the cryo-environment down to less than 20 K. From past experience, we realized that we needed to pay particular attention to making the samples sufficiently large to obtain realistic measurement results that relate to actual applications, especially for temperatures below that of LN2. Thus, we made the samples as large as allowed by the size limitations of the test equipment at the different laboratories, namely, from 15 mm to 250 mm in length. The scatter in the test data obtained by the different laboratories was so large that the results were unreliable and not very useful, which we interpreted to be principally due to the large length range of the samples. Based on these results, we selected Mitsubishi Electric Corporation (MELCO), Japan, for follow-up cryo-measurements because they were able to test 250-mm long samples down to < 10 K. More recently MELCO enlarged their cryo-test equipment to sample sizes as large as 500 mm and with the rather high measurement accuracy of 0.1 ppm/K. In this paper we present the CTE measurement data obtained by the different laboratories and describe the new cryo-test facility at MELCO.

Paper Details

Date Published: 21 August 2009
PDF: 8 pages
Proc. SPIE 7425, Optical Materials and Structures Technologies IV, 742503 (21 August 2009); doi: 10.1117/12.824554
Show Author Affiliations
Matthias R. Krödel, ECM GmbH (Germany)
Tsuyoshi Ozaki, Mitsubishi Electric Corp. (Japan)

Published in SPIE Proceedings Vol. 7425:
Optical Materials and Structures Technologies IV
Joseph L. Robichaud; William A. Goodman, Editor(s)

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