Share Email Print
cover

Proceedings Paper

Low dispersion ghost-controlled optical window/combiner component
Author(s): Paul Atcheson
Format Member Price Non-Member Price
PDF $14.40 $18.00

Paper Abstract

A key consideration in designing optical systems, instruments, or test setups requiring windows or beam combiners is the potential for ghost images to be produced from reflections off the window/combiner surfaces. These ghost images will affect the optical system performance and the level to which that performance can be demonstrated during verification testing. Two common solutions for this are to use anti-reflection coatings and to use wedged substrates. Each has performance implications when used in spectrally broadband systems. The use of coatings alone on windows/combiners results in modest reduction (<100X) of ghost image intensity that can be inadequate when using or testing systems designed to find weak targets near bright objects. Using wedged substrates to shift ghost images outside an image region of interest will introduce chromatic aberrations that limit the fundamental broadband system imaging performance. In this paper we present design parameters for window/combiner assemblies that shift ghost images from a region of interest while controlling the chromatic aberrations to a level whereby the system imaging performance is not adversely affected even for broadband imaging systems with high angular resolution. We then present an example demonstrating the performance of a typical low dispersion, ghost-controlled window/combiner assembly.

Paper Details

Date Published: 27 August 2009
PDF: 8 pages
Proc. SPIE 7436, UV/Optical/IR Space Telescopes: Innovative Technologies and Concepts IV, 74360P (27 August 2009); doi: 10.1117/12.824448
Show Author Affiliations
Paul Atcheson, Ball Aerospace & Technologies Corp. (United States)


Published in SPIE Proceedings Vol. 7436:
UV/Optical/IR Space Telescopes: Innovative Technologies and Concepts IV
Howard A. MacEwen; James B. Breckinridge, Editor(s)

© SPIE. Terms of Use
Back to Top