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Proceedings Paper

Computation of crack tip elastic strain intensity factor in mode I by electronic speckle pattern interferometry
Author(s): Jorge Parra Michel; Amalia Martínez; J. A. Rayas
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Paper Abstract

In this work, a dual illumination beam system is used to obtain the strain intensity factor in mode one (mode I) to mechanical elements during tension testing. The displacement field is obtained by means of a phase stepping technique, and deformations are calculated by the Stokes differentiation method. Results are compared using a finite element analysis technique.

Paper Details

Date Published: 10 September 2009
PDF: 12 pages
Proc. SPIE 7432, Optical Inspection and Metrology for Non-Optics Industries, 74321B (10 September 2009); doi: 10.1117/12.824393
Show Author Affiliations
Jorge Parra Michel, Ctr. de Investigaciones en Óptica, A.C. (Mexico)
Amalia Martínez, Ctr. de Investigaciones en Óptica, A.C. (Mexico)
J. A. Rayas, Ctr. de Investigaciones en Óptica, A.C. (Mexico)


Published in SPIE Proceedings Vol. 7432:
Optical Inspection and Metrology for Non-Optics Industries
Peisen S. Huang; Toru Yoshizawa; Kevin G. Harding, Editor(s)

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