
Proceedings Paper
Recent achievements using chemical vapor composite silicon carbide (CVC SiC)Format | Member Price | Non-Member Price |
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Paper Abstract
This annual review documents our progress towards inexpensive mass production of silicon carbide mirrors and optical
structures. Results are provided for a NASA Small Business Technology Transfer (STTR) X-Ray Mirror project. Trex
partnered with the University of Alabama-Huntsville Center for Advanced Optics (UAH-CAO) to develop fabrication
methods for polished cylindrical and conical chemical vapor composite (CVCTM) SiC mandrels. These mandrels are
envisioned as pre-forms for the replication of fused silica x-ray optics to be eventually used in the International X-Ray
Observatory (IXO). CVC SiCTM offers superior high temperature stability, thermal and mechanical performance and
polishability required for this precision replication process. In this program, Trex fabricated prototype mandrels with
design diameters of 10.5cm, 20cm and 45cm.
UAH-CAO was Trex's university partner in this effort and worked on polishing and metrology of the unusual x-ray
mandrel geometries. UAH-CAO successfully developed an innovative interferometric method for measuring the CVC
SiCTM x-ray mandrels based on a precision cylindrical lens system. UAH-CAO also developed finishing and polishing
methods for CVC SiCTM that utilized a Zeeko IRP200 computer controlled polishing tool. The three technologies key
technologies demonstrated in this program (near net shape forming of CVC SiCTM mandrels, the x-ray mandrel
metrology and free-form polishing capability on CVC SiCTM) could enable cost-effective manufacture of the x-ray
mandrels required for the International X-Ray Observatory (IXO).
Paper Details
Date Published: 21 August 2009
PDF: 13 pages
Proc. SPIE 7425, Optical Materials and Structures Technologies IV, 74250B (21 August 2009); doi: 10.1117/12.824202
Published in SPIE Proceedings Vol. 7425:
Optical Materials and Structures Technologies IV
Joseph L. Robichaud; William A. Goodman, Editor(s)
PDF: 13 pages
Proc. SPIE 7425, Optical Materials and Structures Technologies IV, 74250B (21 August 2009); doi: 10.1117/12.824202
Show Author Affiliations
William A. Goodman, Trex Advanced Materials (United States)
Clifford Tanaka, Trex Advanced Materials (United States)
Published in SPIE Proceedings Vol. 7425:
Optical Materials and Structures Technologies IV
Joseph L. Robichaud; William A. Goodman, Editor(s)
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