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Proceedings Paper

Out-of-plane deformation dynamic measurement method by using virtual speckle pattern based on Carré algorithm
Author(s): Y. Arai; Y. Tsutsumi; S. Yokozeki
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Paper Abstract

Temporal carrier has been introduced to electronic speckle interferometry (ESPI) in order to produce virtual speckle patterns. Dynamic deformation measurement with a large deformation is performed by using virtual speckle patterns. However, it takes a long calculating time to produce virtual speckle patterns, because the method requires Fourier transform operation at each pixel of CCD. In the proposed method, virtual speckle patterns are produced by algorithm without Fourier transform. As the results, it is confirmed that the calculating cost of virtual speckle patterns is improved remarkably, and that the new method also is equal to the ordinary methods in measurement accuracy.

Paper Details

Date Published: 17 June 2009
PDF: 9 pages
Proc. SPIE 7389, Optical Measurement Systems for Industrial Inspection VI, 73890I (17 June 2009); doi: 10.1117/12.824186
Show Author Affiliations
Y. Arai, Kansai Univ. (Japan)
Y. Tsutsumi, Kansai Univ. (Japan)
S. Yokozeki, Jyouko Applied Optics Lab. (Japan)

Published in SPIE Proceedings Vol. 7389:
Optical Measurement Systems for Industrial Inspection VI
Peter H. Lehmann, Editor(s)

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