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Proceedings Paper

An image reconstruction from ECT data of complex flaws
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Paper Abstract

A lack of safety and the reliability of the existing metallic structure can threaten people's lives today. It is getting stronger to demand to ensure reliable safety in society. Non Destructive Testing(NDT) can support to public safety with finding damaged structure. Eddy Current Testing (ECT) is a one of NDT for metallic or conductive materials. It already plays an important role in very wide field such as airline and power plants for maintenance, ironworks for production. Though ECT is considered as a finished testing method,it has the unwanted property that flaw blur in ECT signal.This defect partly comes from the essential principle of ECT. In order to obtain fine image of flaw, the authors proposed a method with signal processing to reconstruct more finer image of flaw from ECT signal. The method is based on simple relationship that signal are expressed as a convolution of response function and flaw shape. Many obtained results, more fine images of points flaw and both short and long line flaw than images of those ECT signal were reconstructed, show validity of the method for those flaws. Nevertheless its aim was fundamental survey on validation of the method so that tested flaws were limited in shape.In this paper,beyond that limitation, the authors wish to report the results of applications to complex shape flaws that are likely to be found in actual inspection site. The obtained reconstructed images show notable results indicate that the validity is kept even for complex flaw.

Paper Details

Date Published: 30 March 2009
PDF: 8 pages
Proc. SPIE 7292, Sensors and Smart Structures Technologies for Civil, Mechanical, and Aerospace Systems 2009, 729224 (30 March 2009); doi: 10.1117/12.824113
Show Author Affiliations
Akira Sasamoto, National Institute of Advanced Industrial Science and Technology (Japan)
Takayuki Suzuki, National Institute of Advanced Industrial Science and Technology (Japan)
Yoshihiro Nishimura, National Institute of Advanced Industrial Science and Technology (Japan)


Published in SPIE Proceedings Vol. 7292:
Sensors and Smart Structures Technologies for Civil, Mechanical, and Aerospace Systems 2009
Masayoshi Tomizuka, Editor(s)

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