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Proceedings Paper

A method for reliability estimation of heterogeneous systems
Author(s): Alin Mihalache; Fabrice Guérin; Mihaela Barreau; Alexis Todoskoff; Ioan Bacivarov; Angelica Bacivarov
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Paper Abstract

Reliability estimation is becoming an important issue of the design process of complex heterogeneous systems. The concept of reliability is frequently seen as being one of the least controlled points and for some as being the critical point. Since these systems are very complex to study, the evaluation of their reliability is extremely difficult. In this paper, we propose a global method to estimate the mechatronic system reliability using operating field data. Since we have a small amount of data, we use an estimation method called Bayesian Restoration Maximization (BRM) method, thus increasing the estimation accuracy. The BRM method needs to define some prior knowledge. For this purpose, we propose to define the prior distribution using a Monte-Carlo simulation based on stochastic Petri Nets (SPN) model and on the operating field data. The stochastic PN model describes the functional and dysfunctional behaviours. In this study, we deal with the case of n repairable systems until a deterministic censoring time (for example, this censoring time may be the warranty period of an ABS system). We consider repair as the replacement of the failing component by an identical one in the case of electronic and mechanical subsystem and in the case of software, the default is rectified on all the subsystems. We simulate the failures times and we compute the confidence interval. The proposed method allows reliability evaluating both for n mechatronic systems and for their different subsystems.

Paper Details

Date Published: 7 January 2009
PDF: 10 pages
Proc. SPIE 7297, Advanced Topics in Optoelectronics, Microelectronics, and Nanotechnologies IV, 72972H (7 January 2009); doi: 10.1117/12.823701
Show Author Affiliations
Alin Mihalache, Univ. d'Angers (France)
Politehnica Univ. of Bucharest (Romania)
Fabrice Guérin, Univ. d'Angers (France)
Mihaela Barreau, Univ. d'Angers (France)
Alexis Todoskoff, Univ. d'Angers (France)
Ioan Bacivarov, Politehnica Univ. of Bucharest (Romania)
Angelica Bacivarov, Politehnica Univ. of Bucharest (Romania)


Published in SPIE Proceedings Vol. 7297:
Advanced Topics in Optoelectronics, Microelectronics, and Nanotechnologies IV
Paul Schiopu; Cornel Panait; George Caruntu; Adrian Manea, Editor(s)

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