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Proceedings Paper

Nano-metrology of macro-systems
Author(s): F. Garoi; D. Apostol; P. Schiopu; P. C. Logofatu; V. Damian
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Paper Abstract

In this paper, a small scale laboratory strainmeter for measuring relative strains is presented. The instrument is a high resolution homodyne interferometer with polarizing optics and special designed electronics for analyzing the output signal of the interferometer. Resolution of the order of λ/8 is obtained in the first instance, with the possibility of improvement by electronic means. Measurement range could vary from microns in the case of earth strains to meters in the case of industrial applications.

Paper Details

Date Published: 7 January 2009
PDF: 6 pages
Proc. SPIE 7297, Advanced Topics in Optoelectronics, Microelectronics, and Nanotechnologies IV, 72971G (7 January 2009); doi: 10.1117/12.823663
Show Author Affiliations
F. Garoi, National Institute for Laser Plasma and Radiation Physics (Romania)
D. Apostol, National Institute for Laser Plasma and Radiation Physics (Romania)
P. Schiopu, Politehnica Univ. of Bucharest (Romania)
P. C. Logofatu, National Institute for Laser Plasma and Radiation Physics (Romania)
V. Damian, National Institute for Laser Plasma and Radiation Physics (Romania)


Published in SPIE Proceedings Vol. 7297:
Advanced Topics in Optoelectronics, Microelectronics, and Nanotechnologies IV
Paul Schiopu; Cornel Panait; George Caruntu; Adrian Manea, Editor(s)

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