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Proceedings Paper

Laser-induced damage studies in optical elements using X-ray laser interferometric microscopy
Author(s): D. Margarone; M. Kozlova; J. Nejdl; B. Rus; T. Mocek; P. Homer; J. Polan; M. Stupka; G. Jamelot; K. Cassou; S. Kazamias; A. Klisnick; D. Ros; H. Bercegol; C. Danson; S. Hawkes
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Paper Abstract

Results of a novel X-ray laser application, aimed at understanding the microscopic effects involved in formation of laserinduced damage in optical materials exposed to sub-ns laser pulses, will be presented. Specifically, we studied thin plane beamsplitters that are presently the weakest element of the next generation of high-energy lasers (LMJ, NIF), with permanent damage threshold below 20 J/cm2. Standard fused silica substrates and a model system, containing welldefined micron grooves as seeding sites to trigger damage when irradiated by 438 nm laser pulses, were in situ probed by a neon-like zinc X-ray laser delivering up to 10 mJ at 21.2 nm. The probing beamline employed a double Lloyd's mirror interferometer, used in conjunction with an imaging mirror to provide magnification of ~8. In conjunction with an array of in-situ optical diagnostics, one of the questions addressed was whether the damage (transient or permanent) on the rear surface of the beamsplitter occurs during or after the laser pulse, i.e. whether it is due to local electrical fields or to other processes. Another issue, examined by both the X-ray interferometric microscopy and the optical diagnostics, is whether a local rear-surface modification is associated with non-linear effects (self-focusing, filamentation) of the laser beam in the bulk.

Paper Details

Date Published: 18 May 2009
PDF: 11 pages
Proc. SPIE 7361, Damage to VUV, EUV, and X-Ray Optics II, 73610N (18 May 2009); doi: 10.1117/12.823302
Show Author Affiliations
D. Margarone, Institute of Physics (Czech Republic)
M. Kozlova, Institute of Physics (Czech Republic)
J. Nejdl, Institute of Physics (Czech Republic)
B. Rus, Institute of Physics (Czech Republic)
T. Mocek, Institute of Physics (Czech Republic)
P. Homer, Institute of Physics (Czech Republic)
J. Polan, Institute of Physics (Czech Republic)
M. Stupka, Institute of Physics (Czech Republic)
G. Jamelot, LIXAM, CNRS, Univ. Paris-Sud (France)
K. Cassou, LIXAM, CNRS, Univ. Paris-Sud (France)
S. Kazamias, LIXAM, CNRS, Univ. Paris-Sud (France)
A. Klisnick, LIXAM, CNRS, Univ. Paris-Sud (France)
D. Ros, LIXAM, CNRS, Univ. Paris-Sud (France)
H. Bercegol, Commissariat à l'Énergie Atomique (France)
C. Danson, Rutherford Appleton Lab. (United Kingdom)
S. Hawkes, Rutherford Appleton Lab. (United Kingdom)


Published in SPIE Proceedings Vol. 7361:
Damage to VUV, EUV, and X-Ray Optics II
Libor Juha; Saša Bajt; Ryszard Sobierajski, Editor(s)

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