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Proceedings Paper

SMART reliability mechanism for very large storage systems
Author(s): Dongjian Luo; Haifeng Zhong; Canhao Pei; Wei Wu; Chengfeng Zhang
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Paper Abstract

In this paper, we investigate the reliability in a petabyte scale storage system built from thousands of Object-Based Storage Devices and study the mechanisms to protect data loss when disk failure happens. We delve in two underlying redundancy mechanisms: 2-way mirroring, 3-way mirroring. To accelerate data reconstruction, Fast Mirroring Copy is employed where the reconstructed objects are stored on different OBSDs throughout the system. A SMART reliability for enhancing the reliability in very large-scale storage system is proposed. Results show that our SMART Reliability Mechanism can utilize the spare resources (including processing, network, and storage resources) to improve the reliability in very large storage systems.

Paper Details

Date Published: 19 March 2009
PDF: 5 pages
Proc. SPIE 7125, Eighth International Symposium on Optical Storage and 2008 International Workshop on Information Data Storage, 712517 (19 March 2009); doi: 10.1117/12.822647
Show Author Affiliations
Dongjian Luo, Huazhong Univ. of Science and Technology (China)
Haifeng Zhong, Huazhong Univ. of Science and Technology (China)
Canhao Pei, Huazhong Univ. of Science and Technology (China)
Wei Wu, Huazhong Univ. of Science and Technology (China)
Chengfeng Zhang, Huazhong Univ. of Science and Technology (China)


Published in SPIE Proceedings Vol. 7125:
Eighth International Symposium on Optical Storage and 2008 International Workshop on Information Data Storage
Fuxi Gan, Editor(s)

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