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Proceedings Paper

Efficient materials processing by dual action of XUV/Vis-NIR ultrashort laser pulses
Author(s): Krzysztof Jakubczak; Tomas Mocek; Jiri Polan; Pavel Homer; Bedrich Rus; I Jong Kim; Chul Min Kim; Seung Beom Park; Tae Keun Kim; Gye Hwang Lee; Chang Hee Nam; Jaromir Chalupsky; Vera Hájková; Libor Juha; Jaroslav Sobota; Tomas Forst
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Paper Abstract

We demonstrate a novel experimental method for efficient structural surface modification of various solids (PMMA, amorphous carbon) achieved by simultaneous action of XUV (21.6 nm), obtained from High-order Harmonic Generation (HHG), and Vis-NIR (410/820 nm) laser pulses. Although the fluence of each individual pulse was far below the surface ablation threshold, very efficient and specific material modification was observed after irradiation even by a single shot of mixed XUV/Vis-NIR radiation.

Paper Details

Date Published: 18 May 2009
PDF: 6 pages
Proc. SPIE 7361, Damage to VUV, EUV, and X-Ray Optics II, 73610A (18 May 2009); doi: 10.1117/12.822433
Show Author Affiliations
Krzysztof Jakubczak, Institute of Physics (Czech Republic)
Tomas Mocek, Institute of Physics (Czech Republic)
Jiri Polan, Institute of Physics (Czech Republic)
Pavel Homer, Institute of Physics (Czech Republic)
Bedrich Rus, Institute of Physics (Czech Republic)
I Jong Kim, Korea Advanced Institute of Science and Technology (Korea, Republic of)
Chul Min Kim, Korea Advanced Institute of Science and Technology (Korea, Republic of)
Seung Beom Park, Korea Advanced Institute of Science and Technology (Korea, Republic of)
Tae Keun Kim, Korea Advanced Institute of Science and Technology (Korea, Republic of)
Gye Hwang Lee, Korea Advanced Institute of Science and Technology (Korea, Republic of)
Chang Hee Nam, Korea Advanced Institute of Science and Technology (Korea, Republic of)
Jaromir Chalupsky, Institute of Physics (Czech Republic)
Vera Hájková, Institute of Physics (Czech Republic)
Libor Juha, Institute of Physics (Czech Republic)
Jaroslav Sobota, Institute of Scientific Instruments (Czech Republic)
Tomas Forst, Institute of Scientific Instruments (Czech Republic)


Published in SPIE Proceedings Vol. 7361:
Damage to VUV, EUV, and X-Ray Optics II
Libor Juha; Saša Bajt; Ryszard Sobierajski, Editor(s)

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