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Proceedings Paper

Determination of third-order aberration coefficients from spherical aberration measurement
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Paper Abstract

The imaging quality of an optical system depends on the magnitude of residual aberrations of the optical system. Aberrations of optical systems can be analytically expressed as a sum of aberrations of different orders. The most important for practice are the third-order aberrations (Seidel aberrations) and the fifth-order aberrations. Our work shows one of possible methods for determination of third-order aberration coefficients that is based on measurement of spherical aberration of the investigated optical system. The advantage of this method for determination of the third-order aberration coefficients is the fact that the measurement of spherical aberration can be experimentally relatively easily performed with a sufficient accuracy. This work presents a detailed theoretical analysis of the proposed method and relations for calculation of the third-order aberration coefficients.

Paper Details

Date Published: 20 November 2008
PDF: 8 pages
Proc. SPIE 7141, 16th Polish-Slovak-Czech Optical Conference on Wave and Quantum Aspects of Contemporary Optics, 71411Z (20 November 2008); doi: 10.1117/12.822417
Show Author Affiliations
Antonin Miks, Czech Technical Univ. in Prague (Czech Republic)
Jiri Novak, Czech Technical Univ. in Prague (Czech Republic)
Pavel Novak, Czech Technical Univ. in Prague (Czech Republic)


Published in SPIE Proceedings Vol. 7141:
16th Polish-Slovak-Czech Optical Conference on Wave and Quantum Aspects of Contemporary Optics
Agnieszka Popiolek-Masajada; Elzbieta Jankowska; Waclaw Urbanczyk, Editor(s)

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