Share Email Print
cover

Proceedings Paper

Terahertz backscattering behavior of various absorbing materials
Author(s): C. Wu; A. J. Gatesman; L. DeRoeck; T. Horgan; R. H. Giles; W. E. Nixon
Format Member Price Non-Member Price
PDF $17.00 $21.00
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

The Submillimeter-Wave Technology Laboratory (STL) at the University of Massachusetts Lowell has investigated the electromagnetic scattering behavior of various broadband absorbers. Several absorbing materials were tested in a compact radar range operating at a center frequency of 160 GHz. The polarimetric radar cross section was measured at elevation angles from 15° to 75°. In addition to the backscattering behavior, the normal incidence transmittance of the materials was evaluated.

Paper Details

Date Published: 30 April 2009
PDF: 12 pages
Proc. SPIE 7311, Terahertz Physics, Devices, and Systems III: Advanced Applications in Industry and Defense, 73110M (30 April 2009); doi: 10.1117/12.822189
Show Author Affiliations
C. Wu, Univ. of Massachusetts, Lowell (United States)
A. J. Gatesman, Univ. of Massachusetts, Lowell (United States)
L. DeRoeck, Univ. of Massachusetts, Lowell (United States)
T. Horgan, Univ. of Massachusetts, Lowell (United States)
R. H. Giles, Univ. of Massachusetts, Lowell (United States)
W. E. Nixon, U.S. Army National Ground Intelligence Ctr. (United States)


Published in SPIE Proceedings Vol. 7311:
Terahertz Physics, Devices, and Systems III: Advanced Applications in Industry and Defense
Mehdi Anwar; Nibir K. Dhar; Thomas W. Crowe, Editor(s)

© SPIE. Terms of Use
Back to Top