Share Email Print
cover

Proceedings Paper

Low-damage preparation techniques of carbonaceous materials for TEM sections using the focused ion beam
Author(s): Nabil D. Bassim; Bradley De Gregorio; Keana Scott; Tsengming Chou; Rhonda M. Stroud
Format Member Price Non-Member Price
PDF $14.40 $18.00

Paper Details

Date Published:
PDF
Proc. SPIE 7378, Scanning Microscopy 2009, 73780J; doi: 10.1117/12.821820
Show Author Affiliations
Nabil D. Bassim, Naval Research Lab. (United States)
Bradley De Gregorio, Naval Research Lab. (United States)
Keana Scott, National Institute of Standards and Technology (United States)
Tsengming Chou, FEI Co. (United States)
Rhonda M. Stroud, Naval Research Lab. (United States)


Published in SPIE Proceedings Vol. 7378:
Scanning Microscopy 2009
Michael T. Postek; Dale E. Newbury; S. Frank Platek; David C. Joy; Michael T. Postek; Dale E. Newbury; S. Frank Platek; David C. Joy; Michael T. Postek; Dale E. Newbury; S. Frank Platek; David C. Joy, Editor(s)

© SPIE. Terms of Use
Back to Top