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Proceedings Paper

FIB/SEM cell sectioning for intracellular metal granules characterization
Author(s): Marziale Milani; Claudia Brundu; Grazia Santisi; Claudio Savoia; Francesco Tatti
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Paper Abstract

Focused Ion Beams (FIBs) provide a cross-sectioning tool for submicron dissection of cells and subcellular structures. In combination with Scanning Electron Microscope (SEM), FIB provides complementary morphological information, that can be further completed by EDX (Energy Dispersive X-ray Spectroscopy). This study focus onto intracellular microstructures, particularly onto metal granules (typically Zn, Cu and Fe) and on the possibility of sectioning digestive gland cells of the terrestrial isopod P. scaber making the granules available for a compositional analysis with EDX. Qualitative and quantitative analysis of metal granules size, amount and distribution are performed. Information is made available of the cellular storing pattern and, indirectly, metal metabolism. The extension to human level is of utmost interest since some pathologies of relevance are metal related. Apart from the common metal-overload-diseases (hereditary hemochromatosis, Wilson's and Menkes disease) it has been demonstrated that metal in excess can influence carcinogenesis in liver, kidney and breast. Therefore protocols will be established for the observation of mammal cells to improve our knowledge about the intracellular metal amount and distribution both in healthy cells and in those affected by primary or secondary metal overload or depletion.

Paper Details

Date Published: 22 May 2009
PDF: 10 pages
Proc. SPIE 7378, Scanning Microscopy 2009, 73780I (22 May 2009); doi: 10.1117/12.821796
Show Author Affiliations
Marziale Milani, Univ. of Milano-Bicocca (Italy)
Claudia Brundu, Univ. of Milano-Bicocca (Italy)
Grazia Santisi, Univ. of Milano-Bicocca (Italy)
Claudio Savoia, STMicroelectronics (Italy)
Francesco Tatti, FEI Italia s.r.l. (Italy)

Published in SPIE Proceedings Vol. 7378:
Scanning Microscopy 2009
Michael T. Postek; Michael T. Postek; Michael T. Postek; Dale E. Newbury; Dale E. Newbury; Dale E. Newbury; S. Frank Platek; S. Frank Platek; S. Frank Platek; David C. Joy; David C. Joy; David C. Joy, Editor(s)

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