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Proceedings Paper

Measurement of subcellular morphology by light scatter filtering with a digital micromirror device
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Paper Abstract

Light scattering methods for assessing structural properties of cells and tissues quantitatively measure morphometric parameters directly without the need for staining. We demonstrate an optical scattering filtering method used in a biological setting that is sensitive to quantifying object orientation and aspect ratio. These parameters are measured in cells both sensitive to and resistant to mitochondrial-mediated apoptosis, the latter having been demonstrated to have shorter mitochondria than apoptosis competent cells. The implementation of the digital micromirror device (DMD) allows for robust filtering of the scatter data, which we implement with Gabor-like filters chosen for their ability to intelligently confine the filter response both in the image and in the scatter regimes. By strategically applying Gabor-like filters to the specific frequencies and orientations in the scatter data, relative changes in object size, orientation and aspect ratio may be derived. Furthermore, using a DMD and filtering the optical scatter data in analog allows us to decouple image resolution from frequency resolution and measure these parameters with high sensitivity for objects within the resolution of the optical system despite an undersampled, lower resolution digital image. As a result, this measurement may be made at lower magnifications with higher throughput and ultimately on a larger population of living and unstained cells imaged simultaneously.

Paper Details

Date Published: 24 February 2009
PDF: 8 pages
Proc. SPIE 7187, Biomedical Applications of Light Scattering III, 71871E (24 February 2009); doi: 10.1117/12.821793
Show Author Affiliations
Robert M. Pasternack, Rutgers Univ. (United States)
Zhen Qian, Rutgers Univ. (United States)
Jing-Yi Zheng, Rutgers Univ. (United States)
Nada N. Boustany, Rutgers Univ. (United States)

Published in SPIE Proceedings Vol. 7187:
Biomedical Applications of Light Scattering III
Adam Wax; Vadim Backman, Editor(s)

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