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Proceedings Paper

PICSiP: new system-in-package technology using a high bandwidth photonic interconnection layer for converged microsystems
Author(s): Tolga Tekin; Michael Töpper; Herbert Reichl
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Paper Abstract

Technological frontiers between semiconductor technology, packaging, and system design are disappearing. Scaling down geometries [1] alone does not provide improvement of performance, less power, smaller size, and lower cost. It will require "More than Moore" [2] through the tighter integration of system level components at the package level. System-in-Package (SiP) will deliver the efficient use of three dimensions (3D) through innovation in packaging and interconnect technology. A key bottleneck to the implementation of high-performance microelectronic systems, including SiP, is the lack of lowlatency, high-bandwidth, and high density off-chip interconnects. Some of the challenges in achieving high-bandwidth chip-to-chip communication using electrical interconnects include the high losses in the substrate dielectric, reflections and impedance discontinuities, and susceptibility to crosstalk [3]. Obviously, the incentive for the use of photonics to overcome the challenges and leverage low-latency and highbandwidth communication will enable the vision of optical computing within next generation architectures. Supercomputers of today offer sustained performance of more than petaflops, which can be increased by utilizing optical interconnects. Next generation computing architectures are needed with ultra low power consumption; ultra high performance with novel interconnection technologies. In this paper we will discuss a CMOS compatible underlying technology to enable next generation optical computing architectures. By introducing a new optical layer within the 3D SiP, the development of converged microsystems, deployment for next generation optical computing architecture will be leveraged.

Paper Details

Date Published: 27 May 2009
PDF: 10 pages
Proc. SPIE 7366, Photonic Materials, Devices, and Applications III, 736618 (27 May 2009); doi: 10.1117/12.821690
Show Author Affiliations
Tolga Tekin, Technische Univ. Berlin (Germany)
Michael Töpper, Fraunhofer-Institut für Zuverlässigkeit und Mikrointegration (Germany)
Herbert Reichl, Technische Univ. Berlin (Germany)


Published in SPIE Proceedings Vol. 7366:
Photonic Materials, Devices, and Applications III
Ali Serpenguzel; Gonçal Badenes; Giancarlo C. Righini, Editor(s)

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