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Preparing liquid, wet, moist and damp specimen for imaging and analysis in the scanning electron microscope
Author(s): Patrick Echlin
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Proc. SPIE 7378, Scanning Microscopy 2009, ; doi: 10.1117/12.821506
Show Author Affiliations
Patrick Echlin, Cambridge Analytical Microscopy Ltd. (United States)


Published in SPIE Proceedings Vol. 7378:
Scanning Microscopy 2009
Michael T. Postek; Dale E. Newbury; S. Frank Platek; David C. Joy; Michael T. Postek; Dale E. Newbury; S. Frank Platek; David C. Joy; Michael T. Postek; Dale E. Newbury; S. Frank Platek; David C. Joy, Editor(s)

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