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Proceedings Paper

Interference between surface harmonics of carrier-envelope phase controlled few-cycle laser field
Author(s): Hidetoshi Nakano; Atsushi Ishizawa; Katsuya Oguri
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Paper Abstract

In this paper, we demonstrate an improved way of providing direct access to the carrier-envelope phase (CEP) in low-energy pulses (nearly 1 μJ) by using the interference between the second harmonic (SH) and the third harmonic (TH) from a solid surface at the same time. The important point is that the spectra of these two harmonics overlap in the UV region. So, the interference signals between the SH and TH from the surface of a solid do not include a constant offset phase component due to the linear dispersion in the SHG crystal and can be used to measure the CEP directly. We describe CEP measurement based on the interference between SH and TH. The result showed that the CEP fluctuation in our system was within ±π/6 even without a slow feedback loop. A slow feedback loop, which compensates for an additional CEP drift caused in the amplifier and the compressor, suppressed the CEP fluctuation within ±π/12 for hours.

Paper Details

Date Published: 18 February 2009
PDF: 8 pages
Proc. SPIE 7276, Photonics and Optoelectronics Meetings (POEM) 2008: Laser Technology and Applications, 72760D (18 February 2009); doi: 10.1117/12.821427
Show Author Affiliations
Hidetoshi Nakano, NTT Basic Research Labs. (Japan)
Atsushi Ishizawa, NTT Basic Research Labs. (Japan)
Katsuya Oguri, NTT Basic Research Labs. (Japan)


Published in SPIE Proceedings Vol. 7276:
Photonics and Optoelectronics Meetings (POEM) 2008: Laser Technology and Applications
Peixiang Lu; Katsumi Midorikawa; Bernd Wilhelmi, Editor(s)

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