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Infrared cameras for inspection of PCBs and semiconductor substrates: how to get good data in a maze of materials
Author(s): Dennis McCabe; Ross W. Overstreet
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Proc. SPIE 7378, Scanning Microscopy 2009, 737821; doi: 10.1117/12.821344
Show Author Affiliations
Dennis McCabe, FLIR Systems, Inc. (United States)
Ross W. Overstreet, FLIR Systems, Inc. (United States)


Published in SPIE Proceedings Vol. 7378:
Scanning Microscopy 2009
Michael T. Postek; Dale E. Newbury; S. Frank Platek; David C. Joy; Michael T. Postek; Dale E. Newbury; S. Frank Platek; David C. Joy; Michael T. Postek; Dale E. Newbury; S. Frank Platek; David C. Joy, Editor(s)

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