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Proceedings Paper

Ratiometric wavelength monitor using a pair of symmetrical multimode interference structures based on silicon-on-insulator (SOI)
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Paper Abstract

An integrated ratiometric wavelength monitor consisting of a Y-branch and a pair of symmetrical multimode interference structures (MMI) based on silicon-on-insulator (SOI) is investigated numerically. Two symmetrical MMIs are optimized in terms of width and length to achieve overlapping opposite slope spectral responses. The designed ratiometric structure demonstrates a suitable spectral response for wavelength measurement, with a high resolution over a 100 nm wavelength range.

Paper Details

Date Published: 20 May 2009
PDF: 8 pages
Proc. SPIE 7366, Photonic Materials, Devices, and Applications III, 73660S (20 May 2009); doi: 10.1117/12.821214
Show Author Affiliations
Agus Muhamad Hatta, Dublin Institute of Technology (Ireland)
Gerald Farrell, Dublin Institute of Technology (Ireland)
Yuliya Semenova, Dublin Institute of Technology (Ireland)
Harendra Fernando, Tyndall National Institute, University College Cork (Ireland)


Published in SPIE Proceedings Vol. 7366:
Photonic Materials, Devices, and Applications III
Ali Serpenguzel; Gonçal Badenes; Giancarlo C. Righini, Editor(s)

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