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Proceedings Paper

Wavefront measurement of miniature aspheric lenses: a fast and accurate inspection technology
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Proc. SPIE TD06, Optifab 2009: Technical Digest, ; doi: 10.1117/12.820974
Show Author Affiliations
Iris Erichsen, Trioptics GmbH (Germany)
Marie Cherrier, Trioptics France (France)
Aiko Ruprecht, Trioptics GmbH (Germany)


Published in SPIE Proceedings Vol. TD06:
Optifab 2009: Technical Digest
James J. Kumler; Matthias Pfaff; James M. Sydor; Richard A. Nasca, Editor(s)

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