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Proceedings Paper

Back-up technologies for IXO
Author(s): R. Hudec; J. Sik; M. Lorenc; L. Pina; V. Semencova; M. Mika; A. Inneman; M. Skulinova
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Paper Abstract

We report on recent progress with development of astronomical X-ray optics based on thermally formed glass foils and on bent Si wafers. Experiments with thermal glass forming have continued adding wider range of evaluated and optimized parameters. Recent efforts with Si wafers have been focused on their quality improvements such as flatness and thickness uniformity in order to better meet the requirements of future X-ray astronomy projects applications, as well as on study of their surface quality, defects analysis, and methods for its reproducible measurement. The role of substrates quality in performance of final mirror arrays, as required by large future space X-ray astronomy experiments was also studied.

Paper Details

Date Published: 30 April 2009
PDF: 12 pages
Proc. SPIE 7360, EUV and X-Ray Optics: Synergy between Laboratory and Space, 73600L (30 April 2009); doi: 10.1117/12.820815
Show Author Affiliations
R. Hudec, Astronomical Institute (Czech Republic)
Czech Technical Univ. (Czech Republic)
J. Sik, ON Semiconductor (Czech Republic)
M. Lorenc, ON Semiconductor (Czech Republic)
L. Pina, Rigaku Innovative Technologies Europe (Czech Republic)
Czech Technical Univ. (Czech Republic)
V. Semencova, Rigaku Innovative Technologies Europe (Czech Republic)
Institute of Chemical Technology (Czech Republic)
M. Mika, Institute of Chemical Technology (Czech Republic)
A. Inneman, Rigaku Innovative Technologies Europe (Czech Republic)
M. Skulinova, Astronomical Institute (Czech Republic)


Published in SPIE Proceedings Vol. 7360:
EUV and X-Ray Optics: Synergy between Laboratory and Space
René Hudec; Ladislav Pina, Editor(s)

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