Share Email Print

Proceedings Paper

Micro force measurement by an optical method
Author(s): N. Khélifa
Format Member Price Non-Member Price
PDF $14.40 $18.00

Paper Abstract

We discuss the application of stress-induced changes in the crystal of a monolithic Nd:YAG laser as a possibility for micro force measurement. In fact, the application of an unknown force on the resonator-amplifier of a laser, formed by a transparent photo elastic material, can lead to a change of the laser frequency by as much as several gigahertz depending on the force intensity. In addition, the rates of change of the two orthogonally polarizations of the same mode with applied force are different. Hence, the strength of the applied force can be deduced from frequency measurement of the beat signal between the two polarizations of the oscillating mode or between the mode polarized in the orthogonal direction of the force and a reference frequency of a stabilized laser.

Paper Details

Date Published: 18 May 2009
PDF: 5 pages
Proc. SPIE 7356, Optical Sensors 2009, 735621 (18 May 2009); doi: 10.1117/12.820800
Show Author Affiliations
N. Khélifa, Conservatoire National des Arts et Métiers (France)

Published in SPIE Proceedings Vol. 7356:
Optical Sensors 2009
Francesco Baldini; Jiri Homola; Robert A. Lieberman, Editor(s)

© SPIE. Terms of Use
Back to Top