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Proceedings Paper

Observation of plasmon-induced optical field enhancement near a pair of partially metal covered dielectric spheres manipulated by optical tweezers
Author(s): Alexander G. Zhdanov; Andrey A. Fedyanin; Satish Rao; Mark Kreuzer; Stefan Ballint; Dmitri Petrov
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Paper Abstract

Optical tweezers technique combined with local confocal luminescence spectroscopy is suggested as a tool for investigation of local optical fields. Utilizing this method plasmon-enhanced optical fields inside a pair of dielectric 2 μm spheres partially covered by 70 nm silver nanoparticles are visualized via field enhanced luminescence of rhodamine dye solution. Positions of the particles are controlled with submicrometer accuracy by two optical traps formed by strongly focused laser beams with λ=980nm. A supplementary beam from CW laser with λ=532nm provided for luminescence excitation is also focused into the sample cavity just to the trapping area. In order to obtain spatial filtering of the signal and separate luminescence signal from an area near the spheres pin-hole based confocal system is designed. The focal volume available for luminescence signal collection turns out to be approximately 3μm x 3 μm x 5 μm. Since optical field is enhanced in the region near plasmon-active 2 μm spheres the enhancement of luminescence intensity is observed. Collective plasmonic effects in two-particle measurements are also considered.

Paper Details

Date Published: 18 May 2009
PDF: 9 pages
Proc. SPIE 7356, Optical Sensors 2009, 735620 (18 May 2009); doi: 10.1117/12.820784
Show Author Affiliations
Alexander G. Zhdanov, Lomonosov Moscow State Univ. (Russian Federation)
Andrey A. Fedyanin, Lomonosov Moscow State Univ. (Russian Federation)
Satish Rao, ICFO-Institute of Photonic Science (Spain)
Mark Kreuzer, ICFO-Institute of Photonic Science (Spain)
Stefan Ballint, ICFO-Institute of Photonic Science (Spain)
Dmitri Petrov, ICFO-Institute of Photonic Science (Spain)

Published in SPIE Proceedings Vol. 7356:
Optical Sensors 2009
Francesco Baldini; Jiri Homola; Robert A. Lieberman, Editor(s)

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