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Proceedings Paper

The micro-strain measurement research of a double-microscopic of digital speckle correlation measurement
Author(s): Kun Ma; Jiaquan Wu; Xiaoyu Chen; Li Xia; Sui Tang; Xunpeng Li
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Paper Abstract

Digital speckle correlation method (DSCM) has been widely used in experimental mechanics to obtain the surface deformation fields. But one of the challenges in practical applications is how to obtain the high accuracy with micros-strain at the measurement precision of με. A double-microscopic of digital speckle correlation measurement is described in this paper. The design concept for the optical system, for which double microscope and double CCD is combined to measure micro-displacement in our experiment. The experiment shown the proposed correlation theory and measurement system method is sufficient satisfies the security engineering measurement needing.

Paper Details

Date Published: 2 February 2009
PDF: 8 pages
Proc. SPIE 7160, 2008 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Applications, 71603A (2 February 2009); doi: 10.1117/12.820718
Show Author Affiliations
Kun Ma, Kumming Univ of Science and Technology (China)
Jiaquan Wu, Kumming Univ of Science and Technology (China)
Xiaoyu Chen, Kumming Univ of Science and Technology (China)
Li Xia, Kumming Univ of Science and Technology (China)
Sui Tang, Kumming Univ of Science and Technology (China)
Xunpeng Li, Kumming Univ of Science and Technology (China)


Published in SPIE Proceedings Vol. 7160:
2008 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Applications
Shenghua Ye; Guangjun Zhang; Jun Ni, Editor(s)

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