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Proceedings Paper

IR analysis of polyvinylidene fluoride doped with transition metal halides
Author(s): Somia M. El Hefnawy; Mervet M. Aboelkher; H. Abdelkader
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Paper Abstract

Pure and doped polyvinylidene fluoride (PVDF) films were prepared by casting. Films with various concentrations of transition metal halides TMHs (AlCl3, ZnCl2, and CoCl2) were prepared. The microstructure and physical properties of these films were studied by IR analysis. The two factors affecting the interaction between the PVDF and MHs are (i) the dopant weight fraction (Hc) (0.05% -30%) by weght, and (ii) precasting time (tpc) which is the time during which the PVDF pellets are maintained solved with the halides added before casting. From the IR quantitative analysis, it is evident that the addition of the three MH to the undoped PVDF film makes β-phase as the dominant crystalline structures in the doped films without the need for mechanical drawing treatment. The precasting time plays a role for new crystalline structures to appear which becomes strong for CoCl2 doping, moderate in ZnCl2 doping and weak in AlCl3 doping. This phase is maximum for the relatively low doping levels < 5%. The stability of these structures in the samples doped with CoCl2 is high compared to the doping with ZnCl2 and AlCl3. This result is extremely important hence the β-phase is that one which is electrically active compared with the other two phases and it is needed in all the samples used in the useful applications of the PVF2 films. Remembering, that β-phase is obtained in the crystallization from melt samples by the uneasy mechanical stress and elevated temperature, it becomes evident the importance of the present result.

Paper Details

Date Published: 22 May 2009
PDF: 11 pages
Proc. SPIE 7378, Scanning Microscopy 2009, 73780T (22 May 2009); doi: 10.1117/12.820521
Show Author Affiliations
Somia M. El Hefnawy, Mansoura Univ. (Egypt)
Mervet M. Aboelkher, Mansoura Univ. (Egypt)
H. Abdelkader, Mansoura Univ. (Egypt)


Published in SPIE Proceedings Vol. 7378:
Scanning Microscopy 2009
Michael T. Postek; Michael T. Postek; Michael T. Postek; Dale E. Newbury; Dale E. Newbury; Dale E. Newbury; S. Frank Platek; S. Frank Platek; S. Frank Platek; David C. Joy; David C. Joy; David C. Joy, Editor(s)

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