Share Email Print
cover

Proceedings Paper

A new approach to architecture of sensor networks for mission-oriented applications
Author(s): Chi Harold Liu; Kin K. Leung; Chatschik Bisdikian; Joel W. Branch
Format Member Price Non-Member Price
PDF $14.40 $18.00

Paper Abstract

In this paper, a novel mission-oriented sensor network architecture for military applications is proposed involving multiple sensing missions with varying quality of information (QoI) requirements. A new concept of mission QoI satisfaction index indicating the degree of satisfaction for any mission in the network is introduced. Furthermore, the 5WH (why, when, where, what, who, how) principle on the operational context of information is extended to capture the changes of QoI satisfaction indexes for mission admission and completion. These allow modeling the whole network as a "black box". With system inputs including the QoI requirements of the existing and newly arriving missions and output the QoI satisfaction index, the new concept of sensor network capacity is introduced and mathematically described. The QoI-centric sensor network capacity is a key element of the proposed architecture and aids controlling of admission of newly arriving missions in accordance with the QoI needs of all (existing and newly admitted missions). Finally, the proposed architecture and its key design parameters are illustrated through an example of a sensor network deployed for detecting the presence of a hazardous, chemical material.

Paper Details

Date Published: 2 May 2009
PDF: 12 pages
Proc. SPIE 7349, Wireless Sensing and Processing IV, 73490L (2 May 2009); doi: 10.1117/12.820199
Show Author Affiliations
Chi Harold Liu, Imperial College London (United Kingdom)
Kin K. Leung, Imperial College London (United Kingdom)
Chatschik Bisdikian, IBM Thomas J. Watson Research Ctr. (United States)
Joel W. Branch, IBM Thomas J. Watson Research Ctr. (United States)


Published in SPIE Proceedings Vol. 7349:
Wireless Sensing and Processing IV
Sohail A. Dianat; Michael D. Zoltowski, Editor(s)

© SPIE. Terms of Use
Back to Top