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Proceedings Paper

Measurement and analysis of optical surface properties for input to ShipIR
Author(s): David A. Vaitekunas; Jim Jafolla; Paul McKenna; Martin Szczesniak
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Paper Abstract

A new standard for the measurement and analysis of optical surface properties for input to the ShipIR model (Vaitekunas, 2002) are developed and tested using paint specimens taken from the unclassified Canadian research vessel (CFAV Quest). The theory and equations used to convert the in-lab surface property measurements into ShipIR model input parameters are described. The resultant data consists of two thermal model input parameters, solar absorptivity (αs) and thermal emissivity epsilon;Τ), and a series of in-band surface properties, the nominal emissivity (ε), nominal specular reflectance (ρs), angular lobe-width (e) and a grazing-angle (b) parameter. Original sample measurements in 2004 are supplemented with new hemispherical directional reflectance (HDR) and bi-directional reflectance distribution function (BRDF) measurements in 2008 to track the changes in the paint specimens and expand the analysis to include additional input parameters to ShipIR. A more rigorous treatment of the BRDF model relates the HDR and BRDF measurements to a single surface roughness parameter (σ).

Paper Details

Date Published: 22 April 2009
PDF: 11 pages
Proc. SPIE 7300, Infrared Imaging Systems: Design, Analysis, Modeling, and Testing XX, 73000M (22 April 2009); doi: 10.1117/12.820055
Show Author Affiliations
David A. Vaitekunas, W. R. Davis Engineering, Ltd. (Canada)
Jim Jafolla, Surface Optics Corp. (United States)
Paul McKenna, Surface Optics Corp. (United States)
Martin Szczesniak, Surface Optics Corp. (United States)


Published in SPIE Proceedings Vol. 7300:
Infrared Imaging Systems: Design, Analysis, Modeling, and Testing XX
Gerald C. Holst, Editor(s)

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