Share Email Print
cover

Proceedings Paper

Wavelet entropy based damage identification using wireless smart sensors
Author(s): Gun-Jin Yun; Soon-Gie Lee; Joan Carletta; Tomonori Nagayama
Format Member Price Non-Member Price
PDF $14.40 $18.00
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

In this paper, a wavelet entropy based damage identification method is experimentally validated using wireless smart sensor units (Imote2) with TinyOS-based firmware. Recently, the wireless smart sensor network has drawn significant attention for applications in Structural Health Monitoring (SHM). Wavelet entropy is considered to be a damagesensitive signature that can be obtained both at different spatial locations and time stations to indicate changes in dynamic responses of structures. Compared to metrics based on the Fourier Transform, metrics based on wavelets require much simpler mathematics, with no complex numbers. Thus wavelet-based SHM methods would be easier to embed on motes. Wavelets can have other (mathematical) advantages when the structures are complex and the dynamic signals are non-stationary. Particularly, use of the relative wavelet entropy (RWE) has been extensively explored for use in damage detection using wireless smart sensors. First, sensor validation tests have been conducted using wireless and wired sensors. To verify an off-line time synchronization technique and the feasibility of using acceleration data from wireless sensors, modal identifications have been conducted using the ERA technique. Finally, the wavelet entropy based damage detection method has been demonstrated using Imote2 wireless smart sensors.

Paper Details

Date Published: 30 March 2009
PDF: 11 pages
Proc. SPIE 7292, Sensors and Smart Structures Technologies for Civil, Mechanical, and Aerospace Systems 2009, 72923R (30 March 2009); doi: 10.1117/12.819987
Show Author Affiliations
Gun-Jin Yun, Univ. of Akron (United States)
Soon-Gie Lee, Univ. of Akron (United States)
Joan Carletta, Univ. of Akron (United States)
Tomonori Nagayama, The Univ. of Tokyo (Japan)


Published in SPIE Proceedings Vol. 7292:
Sensors and Smart Structures Technologies for Civil, Mechanical, and Aerospace Systems 2009
Masayoshi Tomizuka, Editor(s)

© SPIE. Terms of Use
Back to Top