Share Email Print
cover

Proceedings Paper

A study on the disparity of an advanced multi-sparkle camera system
Author(s): Fan Yang; Jingzhen Li; Qingyang Wu; Luwen Tan; Xiaowei Lu
Format Member Price Non-Member Price
PDF $14.40 $18.00
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

This paper analyses a disparity correction of an advanced multi-sparkle camera system. This system is also called Cranz-Schardin camera, which a method to achieve extreme high-speed photography. The camera axis in this system have an angle with principal optical axis, so each image taking by different cameras in system is formed by different orientation projections of the object, and this process generates parallax among the different cameras. In order to solve this problem, camera calibration method is setting up after a detailed analysis of this system. A planar calibration is used as standard reference object in experiment. And image corresponding relationship among different cameras can be built through learning the position changes of feature points in different cameras. Then, grab pictures from transient phenomenon which need to be analyzed, and after image processing on these pictures with the image corresponding relationship, the disparity influence on experiment images in this advanced multi-sparkle camera system would be diminished.

Paper Details

Date Published: 28 January 2009
PDF: 5 pages
Proc. SPIE 7156, 2008 International Conference on Optical Instruments and Technology: Optical Systems and Optoelectronic Instruments, 71563H (28 January 2009); doi: 10.1117/12.819859
Show Author Affiliations
Fan Yang, Shenzhen Univ. (China)
Jingzhen Li, Shenzhen Univ. (China)
Qingyang Wu, Shenzhen Univ. (China)
Luwen Tan, Shenzhen Univ. (China)
Xiaowei Lu, Shenzhen Univ. (China)


Published in SPIE Proceedings Vol. 7156:
2008 International Conference on Optical Instruments and Technology: Optical Systems and Optoelectronic Instruments
Yunlong Sheng; Yongtian Wang; Lijiang Zeng, Editor(s)

© SPIE. Terms of Use
Back to Top