Share Email Print
cover

Proceedings Paper

Effect of ambient light on surface roughness inspection
Author(s): Zixin Chen; Zhisheng Zhang; Jinfei Shi; Ruwen Chen; Ren Huang
Format Member Price Non-Member Price
PDF $17.00 $21.00

Paper Abstract

Machine vision is used to assess surface roughness of work pieces in different circumstance light conditions. Different from the traditional stylus way, the machine vision method is a non-contact and non-destructive surface inspection method, and therefore has the prospect in manufacturing application. The effect of ambient light on gray-level distribution parameters was first analyzed. Then a new method, which counts the pixel numbers whose gray value is larger than sum of the Otsu threshold and a given constant, was proposed to represent different roughness. Finally some experiments were conducted to compare the proposed method with other two methods-the first is the method based on standard deviation and root mean square height of the gray-level distribution proposed by Luk, and the second is on gray-level co-occurrence matrix-to evaluate surfaces with different roughness in different conditions. The parameters, such as the constant of the proposed method, the distance and the angle of the gray-level co-occurrence matrix, were optimized to obtain better inspecting performance. Results show that the variance sum between inspecting values of the proposed method and its corresponding real surface roughness is less than half of the other two ways.

Paper Details

Date Published: 31 December 2008
PDF: 7 pages
Proc. SPIE 7130, Fourth International Symposium on Precision Mechanical Measurements, 71301P (31 December 2008); doi: 10.1117/12.819599
Show Author Affiliations
Zixin Chen, Southeast Univ. (China)
Zhisheng Zhang, Southeast Univ. (China)
Jinfei Shi, Southeast Univ. (China)
Ruwen Chen, Southeast Univ. (China)
Ren Huang, Southeast Univ. (China)


Published in SPIE Proceedings Vol. 7130:
Fourth International Symposium on Precision Mechanical Measurements
Yetai Fei; Kuang-Chao Fan; Rongsheng Lu, Editor(s)

© SPIE. Terms of Use
Back to Top