Share Email Print
cover

Proceedings Paper

Longwave multispectral diffractive optic imaging spectrometer
Author(s): David Kryskowski; Justin Renken
Format Member Price Non-Member Price
PDF $14.40 $18.00
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

Ann Arbor Sensor Systems is developing and experimenting with a Long Wave Multispectral Diffractive Optic Imaging Spectrometer that operates in the 7 to 14 micron band. The instrument currently under development is for fixed mount applications. The focal plane is an uncooled 320 x 240 30 micron pitch amorphous silicon microbolometer array. With a spectral bandwidth of 220nm the unit is capable of resolving moderate to broad spectral features. This paper will describe the physical characteristics and characterization of the experimental device. Design trades and test data will be presented.

Paper Details

Date Published: 27 April 2009
PDF: 12 pages
Proc. SPIE 7334, Algorithms and Technologies for Multispectral, Hyperspectral, and Ultraspectral Imagery XV, 73340G (27 April 2009); doi: 10.1117/12.819070
Show Author Affiliations
David Kryskowski, Ann Arbor Sensor Systems, LLC (United States)
Justin Renken, Ann Arbor Sensor Systems, LLC (United States)


Published in SPIE Proceedings Vol. 7334:
Algorithms and Technologies for Multispectral, Hyperspectral, and Ultraspectral Imagery XV
Sylvia S. Shen; Paul E. Lewis, Editor(s)

© SPIE. Terms of Use
Back to Top