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Proceedings Paper

Passive millimeter-wave cross polarization imaging and phenomenology
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Paper Abstract

Passive millimeter-wave (mmW) imaging has many specific defense, security and safety applications, due to the fact that all terrestrial bodies above absolute zero are emissive, and these wavelengths are not scattered by normal obscurants such as haze, fog, smoke, dust, sandstorms, clouds, or fabrics. We have previously demonstrated results from the construction of a 94 GHz passive mmW far-field imaging system utilizing optical upconversion, which imaged in only horizontal polarization. The effective radiometric temperature of an object is a combination of the object's surface and scattered radiometric temperatures. The surface radiometric temperature is a function of the object's emissivity, which is polarization dependent. Imaging with radiometric temperature data from both polarizations will allow a greater identification of the scene being imaged, and allow the recognition of subtle features which were not previously observable. This additional functionality is accomplished through the installation of added equipment and programming on our system, thus allowing the simultaneous data collection of imagery in both polarizations. Herein, we present our experimental procedures, results and passive mmW images obtained by using our far-field imaging system, a brief discussion of the phenomenology observed through the application of these techniques, as well as the preliminary details regarding our work on a 3-D passive mmW simulator capable of true physical polarization dependent effective emissivity and reflectivity rendering, based on the open-source Blender engine.

Paper Details

Date Published: 5 May 2009
PDF: 11 pages
Proc. SPIE 7309, Passive Millimeter-Wave Imaging Technology XII, 730902 (5 May 2009); doi: 10.1117/12.819033
Show Author Affiliations
E. Lee Stein, Univ. of Delaware (United States)
Christopher A. Schuetz, Phase Sensitive Innovations, Inc. (United States)
Richard D. Martin, Phase Sensitive Innovations, Inc. (United States)
Jesse P. Samluk, Univ. of Delaware (United States)
John P. Wilson, Univ. of Delaware (United States)
Daniel G. Mackrides, Phase Sensitive Innovations, Inc. (United States)
Janusz A. Murakowski, Univ. of Delaware (United States)
Maciej Murakowski, Univ. of Delaware (United States)
Dennis W. Prather, Univ. of Delaware (United States)


Published in SPIE Proceedings Vol. 7309:
Passive Millimeter-Wave Imaging Technology XII
Roger Appleby; David A. Wikner, Editor(s)

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