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Proceedings Paper

Visualization as integration of heterogeneous processes
Author(s): Xiaoyu Wang; Wenwen Dou; William Ribarsky; Remco Chang
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Paper Abstract

In the information age today, we are experiencing an explosion of data and information from a variety of sources unlike anything that the world has seen before. While technology has advanced to keep up with the collection and storage of data, what we lack now is the ability to analyze and understand the meaning behind the data. Traditionally, data mining and data management techniques require the data to be uniform such that a single process can search for knowledge within the data. However, in analysis of complex tasks where knowledge and information need to be pieced together from different sources of data, a new paradigm is required. In this paper, we present a framework of using visual analytical approaches to integrate multiple heterogeneous processes that can each analyze a specific type of data. Under this framework, stand-alone software solutions can focus on specific aspects of the problem based on domain-specific techniques. The framework serves as a visual repository for all the information and knowledge discovered by each individual process, and allows the user to interactively perform sense-making analysis to form a cohesive and comprehensive understanding of the problem at hand. We demonstrate the effectiveness of this framework by applying it to inspecting bridge conditions that utilizes data sources from 2D imagery, 3D LiDAR, and multi-dimensional data based on bridge reports.

Paper Details

Date Published: 30 April 2009
PDF: 8 pages
Proc. SPIE 7346, Visual Analytics for Homeland Defense and Security, 73460B (30 April 2009); doi: 10.1117/12.818777
Show Author Affiliations
Xiaoyu Wang, Univ. of North Carolina at Charlotte (United States)
Wenwen Dou, Univ. of North Carolina at Charlotte (United States)
William Ribarsky, Univ. of North Carolina at Charlotte (United States)
Remco Chang, Univ. of North Carolina at Charlotte (United States)


Published in SPIE Proceedings Vol. 7346:
Visual Analytics for Homeland Defense and Security
William J. Tolone; William Ribarsky, Editor(s)

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