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Proceedings Paper

MIRAGE WF infrared scene projector system, with 1536 x 768 wide format resistive array, performance data
Author(s): Kevin Sparkman; Joe Laveigne; Jim Oleson; Greg Franks; Steve McHugh; John Lannon; Brian Woode; Derek Greer; Nicole Bui
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Paper Abstract

MIRAGE WF is the latest high definition version of the MIRAGE infrared scene projector product line from Santa Barbara Infrared Inc. (SBIR). MIRAGE WF is being developed under the Wide Format Resistive Array (WFRA) program. The WFRA development is one of several efforts within the Infrared Sensor Simulator - Preplanned Product Improvement (IRSS P3I) umbrella funded by the Central Test and Evaluation Investment Program (CTEIP) and led by the US Navy at Patuxent River, MD. Three MIRAGE WF infrared scene projection systems are being delivered as part of the WFRA program. The main differences between the MIRAGE XL (1024x1024) and MIRAGE WF are a 1536x768 emitter array and 100Hz true raster capability. The key emitter requirements that have been measured and will be discussed include: Operability, Maximum Apparent Temperature, Rise Time and Array Uniformity. Key System specifications are: 1536x768 pixels, maximum apparent temperature of 600K, maximum frame rate of 100Hz, raster and snap shot updating, radiance rise and fall time less than 5 ms and windowed mode (1024x768) operation at up to 200 Hz.

Paper Details

Date Published: 22 April 2009
PDF: 9 pages
Proc. SPIE 7301, Technologies for Synthetic Environments: Hardware-in-the-Loop Testing XIV, 73010F (22 April 2009); doi: 10.1117/12.818390
Show Author Affiliations
Kevin Sparkman, Santa Barbara Infrared, Inc. (United States)
Joe Laveigne, Santa Barbara Infrared, Inc. (United States)
Jim Oleson, Santa Barbara Infrared, Inc. (United States)
Greg Franks, Santa Barbara Infrared, Inc. (United States)
Steve McHugh, Santa Barbara Infrared, Inc. (United States)
John Lannon, RTI International (United States)
Brian Woode, NAWCAD (United States)
Derek Greer, NAWCAD (United States)
Nicole Bui, US Army (United States)

Published in SPIE Proceedings Vol. 7301:
Technologies for Synthetic Environments: Hardware-in-the-Loop Testing XIV
James A. Buford Jr.; Robert Lee Murrer Jr., Editor(s)

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