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Proceedings Paper

Measurement results for time-delayed source interferometers for windows, hemispherical domes, and tangent ogives
Author(s): William P. Kuhn; Matthew B. Dubin; Robert S. LeCompte; Hector P. Durazo
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Paper Abstract

A time-delayed source interferometer manipulates the output of a short-coherence length source so that light reflected from the two surfaces of a nominally constant-thickness optical component interfere. The interference pattern is a measure of optical thickness variation and can be phase-shifted. The approach is well suited to optical components that are nominally constant thickness over some portion of the surface. Interferometers suited to the measurement of windows, hemispherical domes and tangent ogives have been built. Data acquisition, calibration tooling and processing methods are described for the stitching of phase data.

Paper Details

Date Published: 27 April 2009
PDF: 15 pages
Proc. SPIE 7302, Window and Dome Technologies and Materials XI, 73020R (27 April 2009); doi: 10.1117/12.818386
Show Author Affiliations
William P. Kuhn, Opt-E (United States)
Matthew B. Dubin, College of Optical Sciences, The Univ. of Arizona (United States)
Robert S. LeCompte, Breault Research Organization, Inc. (United States)
Hector P. Durazo, Breault Research Organization, Inc. (United States)


Published in SPIE Proceedings Vol. 7302:
Window and Dome Technologies and Materials XI
Randal W. Tustison, Editor(s)

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