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Proceedings Paper

Design and implementation of a new time-delayed source and alignment considerations for a tangent ogive interferometer
Author(s): Hector P. Durazo; William P. Kuhn; Robert S. LeCompte; Matthew B. Dubin
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Paper Abstract

A new Time Delayed Source (TDS) has been designed to work with a transmitted wavefront interferometer. The TDS splits a short-coherence wavelength source into two halves, introduces a time delay between the two halves and then recombines the two halves. The recombined wavefronts are fed into a transmitted wavefront interferometer to measure the optical path difference (OPD) between the two surfaces of a part. The time delay is adjusted to match the separation between the two surfaces of the part allowing phase shifting techniques to be used to measure the OPD. The measurement approach can be adapted to measure nominally constant thickness windows, spherical domes and tangent ogives through the design of suitable wavefront matching optics. Producing the wavefront to measure a tangent ogive is accomplished by a series of sub-apertures, each measuring a section of a tangent ogive. The tangent ogive is placed on a rotary stage, and as it rotates, sub-aperture measurements are taken and later stitched together to generate a complete measurement of the part. Alignment of each sub-aperture instrument is essential to obtain an accurate measurement. The setup and alignment of a tangent ogive transmitted wavefront interferometer is also described.

Paper Details

Date Published: 27 April 2009
PDF: 7 pages
Proc. SPIE 7302, Window and Dome Technologies and Materials XI, 730215 (27 April 2009); doi: 10.1117/12.818385
Show Author Affiliations
Hector P. Durazo, Breault Research Organization (United States)
William P. Kuhn, Opt-E (United States)
Robert S. LeCompte, Breault Research Organization (United States)
Matthew B. Dubin, College of Optical Sciences, The Univ. of Arizona (United States)


Published in SPIE Proceedings Vol. 7302:
Window and Dome Technologies and Materials XI
Randal W. Tustison, Editor(s)

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