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Proceedings Paper

Symmetric light beam splitting in sillenite crystals
Author(s): E. Yu. Ageyev; R. V. Litvinov; N. D. Hatkov
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Paper Abstract

We theoretically investigate the propagation of a one-dimensional (1D) polarized light beam in cubic photorefractive crystals of 23 symmetry group. Light beam propagation was considered under condition applied to the crystal external electric field for increasing the photorefractive response. Within paraxial approach we obtain the self-consistent system of equations for scalar amplitudes of two optical eigenmodes and the photoinduced space charge field. We have shown that the natural circular and induced by external and internal electric field linear birefringence determine the character of transformation of the spatial structure of the beam. For transverse optical configuration of the crystal sample and length of light waves λ = 633 nm we demonstrate that in a crystal the Gaussian light beam is splitted into two beams. That beams spread symmetrically relative to the normal to the entrance edge of the sample. A feature of this process is the soliton formation in each of that beams. Process of spatial soliton formation is accompanied by scattering of light energy. The solitons cross-size a lot less than the width of the incident Gaussian beam, which was 30 micron in our calculations. Under such conditions soliton eigenmodes is formed in the BS0 and BT0 crystals with non-local photorefractive response.

Paper Details

Date Published: 18 November 2008
PDF: 6 pages
Proc. SPIE 7138, Photonics, Devices, and Systems IV, 71381U (18 November 2008); doi: 10.1117/12.818059
Show Author Affiliations
E. Yu. Ageyev, Tomsk State Univ. of Control Systems and Radioelectronics (Russian Federation)
R. V. Litvinov, Tomsk State Univ. of Control Systems and Radioelectronics (Russian Federation)
N. D. Hatkov, Tomsk State Univ. of Control Systems and Radioelectronics (Russian Federation)


Published in SPIE Proceedings Vol. 7138:
Photonics, Devices, and Systems IV
Pavel Tománek; Dagmar Senderáková; Miroslav Hrabovský, Editor(s)

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