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Proceedings Paper

Full characterization of integrated optical ring-resonators by phase-sensitive time-domain interferometry
Author(s): Antonio Canciamilla; Francesco Morichetti; Andrea Melloni
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Paper Abstract

Time-domain interferometry (TDI) is a well-established measurement technique that can be used for the characterization of either optical devices or pulses. Conceptually, TDI needs a variable-delay interferometer for evaluating the crosscorrelation between an optical signal propagating through an optical device and a reference field undergoing a controllable delay. In this contribution, a simple and flexible phase-sensitive interferometric setup combining two different TDI schemes is presented. The first scheme, employing a broadband optical source, implements an optical lowcoherence interferometry (OLCI) system, which enables an accurate frequency-domain characterization of generic optical devices. In the second scheme, referred to as optical coherence pulsed interferometry (OCPI), a pulse modulated coherent source is used to observe in time-domain the propagation of optical pulse through optical devices, providing a direct observation of the true-time delay and the envelope distortion experienced by the pulse. The two techniques are implemented on the same interferometric setup and can be combined to achieve a full time-domain and frequencydomain characterization. Some examples concerning the characterization of integrated coupled ring-resonators devices are presented and compared with alternative measurement techniques.

Paper Details

Date Published: 18 November 2008
PDF: 6 pages
Proc. SPIE 7138, Photonics, Devices, and Systems IV, 71381L (18 November 2008); doi: 10.1117/12.818043
Show Author Affiliations
Antonio Canciamilla, Politecnico di Milano (Italy)
Francesco Morichetti, Politecnico di Milano (Italy)
CoreComm-Consortium for Researches in Optical Processing and Switching (Italy)
Andrea Melloni, Politecnico di Milano (Italy)


Published in SPIE Proceedings Vol. 7138:
Photonics, Devices, and Systems IV
Pavel Tománek; Dagmar Senderáková; Miroslav Hrabovský, Editor(s)

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