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Proceedings Paper

Microsystem technology based diode lasers and Raman sensors for in situ food quality control
Author(s): B. Sumpf; H. Schmidt; M. Maiwald; A. Müller; G. Erbert; H.-D. Kronfeldt; G. Tränkle
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Paper Abstract

A microsystem based Raman sensor system for the in situ control of meat was realized. As excitation laser source a compact external cavity diode laser (ECDL) emitting at 671.0 nm mounted on a micro optical bench with a total dimension of (13 x 4 x 1) mm3 is implemented. An output power of 200 mW, a stable emission at 671.0 nm, and a narrow spectral width of about 80 pm, i.e. 2 cm-1, were measured. The device is well suited for Raman measurements of liquid and solid samples. The devices parameters and the stability will be reviewed. The micro-system laser device is implemented into a specifically laboratory prototype, including an optical bench with a diameter of 25 mm and a length of 170 mm. The probe is coupled fiber-optically to a polychromator with CCD detector for rapid spectral analysis. The Raman probe is characterized and first Raman measurements of porcine musculus longissimus dorsi through the package will be presented. The usefulness of Raman spectroscopy will be discussed with a view of integrating the sensor in a handheld laser scanner for food control.

Paper Details

Date Published: 27 April 2009
PDF: 8 pages
Proc. SPIE 7315, Sensing for Agriculture and Food Quality and Safety, 731508 (27 April 2009); doi: 10.1117/12.817912
Show Author Affiliations
B. Sumpf, Ferdinand-Braun-Institut für Höchstfrequenztechnik (Germany)
H. Schmidt, Technische Univ. Berlin (Germany)
M. Maiwald, Ferdinand-Braun-Institut für Höchstfrequenztechnik (Germany)
A. Müller, Ferdinand-Braun-Institut für Höchstfrequenztechnik (Germany)
G. Erbert, Ferdinand-Braun-Institut für Höchstfrequenztechnik (Germany)
H.-D. Kronfeldt, Technische Univ. Berlin (Germany)
G. Tränkle, Ferdinand-Braun-Institut für Höchstfrequenztechnik (Germany)

Published in SPIE Proceedings Vol. 7315:
Sensing for Agriculture and Food Quality and Safety
Moon S. Kim; Shu-I Tu; Kaunglin Chao, Editor(s)

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