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Proceedings Paper

Interference fringe analysis using wavelet transform
Author(s): Takamasa Suzuki; Ryo Kiyohara; Mika Ichikawa; Osami Sasaki
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Paper Abstract

Fringe analysis methods that employ wavelet transform are described. The performances of the methods are examined from the viewpoints of required calculation time and accuracy. Further, accuracies of calculations performed using linear and logarithmic scales in wavelet transform are compared. Experimental results show that wavelet signal processing is effective in measuring profiles having large and gradual asperities.

Paper Details

Date Published: 2 February 2009
PDF: 12 pages
Proc. SPIE 7160, 2008 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Applications, 716002 (2 February 2009); doi: 10.1117/12.817853
Show Author Affiliations
Takamasa Suzuki, Niigata Univ. (Japan)
Ryo Kiyohara, Niigata Univ. (Japan)
Mika Ichikawa, Niigata Univ. (Japan)
Osami Sasaki, Niigata Univ. (Japan)


Published in SPIE Proceedings Vol. 7160:
2008 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Applications
Shenghua Ye; Guangjun Zhang; Jun Ni, Editor(s)

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