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Proceedings Paper

News applications in authentication and traceability using ultrafast laser marking
Author(s): B. Dusser; Z. Sagan; A. Foucou; M. Jourlin; E. Audouard
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Paper Abstract

This work presents a new method for ultra-fast laser marking using nano-structures as well as a suitable method of reading. These nano-structures, called ripples, are an irregular grating with a controllable orientation. It is possible to observe these ripples and theirs orientations with differents acquisitions systems. The one we chose to use is a scanner. It is possible to have an ripples' orientation matching one of the colors in the image acquisition. This feature allows us to consider new applications for marking and new types of identifying code.

Paper Details

Date Published: 24 February 2009
PDF: 8 pages
Proc. SPIE 7201, Laser Applications in Microelectronic and Optoelectronic Manufacturing VII, 72010V (24 February 2009); doi: 10.1117/12.816886
Show Author Affiliations
B. Dusser, ATT Advanced Track & Trace (France)
Z. Sagan, ATT Advanced Track & Trace (France)
A. Foucou, ATT Advanced Track & Trace (France)
M. Jourlin, Lab. Hubert Curien, CNRS (France)
E. Audouard, Lab. Hubert Curien, CNRS (France)


Published in SPIE Proceedings Vol. 7201:
Laser Applications in Microelectronic and Optoelectronic Manufacturing VII
Michel Meunier; Andrew S. Holmes; Hiroyuki Niino; Bo Gu, Editor(s)

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