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Proceedings Paper

C-QWIP focal plane array sensitivity
Author(s): K. K. Choi; D. P. Forrai; D. Endres; J. Sun; P. Pinsukanjana; J. W. Devitt
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Paper Abstract

We are developing corrugated quantum well infrared photodetector (C-QWIP) technology for long wavelength applications. A number of large format 1024 × 1024 C-QWIP focal plane arrays (FPAs) have been demonstrated. The measured quantum efficiency η is ranging from 15 - 37%, depending on the detector type, doping density and number of quantum wells in the detector material. The photoconductive gain is between 0.07 and 0.19, while the spectral width is between 1.5 and 3.5 microns. Despite the large integrated η of the C-QWIPs, the number of collected photoelectrons can be limited in shorter cutoff, small pixel FPAs under high speed operation. In this case, the read noise will have a large impact on the system sensitivity. In this paper, we will discuss the detector model, the measured pixel characteristics, and the effects of read noise on the FPA performance. Our analysis shows that the tolerable read noise improves with the cutoff wavelength. For example, to achieve a sensitivity of 20 mK at 2 msec integration time, the respective read noise will be 1000, 2000, 3000, and 4000 e¯ at λc = 8.8, 9.4, 10.7 and 11.7 μm. This analysis will help to determine the read noise requirement for the C-QWIP FPAs.

Paper Details

Date Published: 6 May 2009
PDF: 11 pages
Proc. SPIE 7298, Infrared Technology and Applications XXXV, 729807 (6 May 2009); doi: 10.1117/12.816617
Show Author Affiliations
K. K. Choi, Army Research Lab. (United States)
D. P. Forrai, L-3 Communications Cincinnati Electronics (United States)
D. Endres, L-3 Communications Cincinnati Electronics (United States)
J. Sun, Army Research Lab. (United States)
P. Pinsukanjana, Intelligent Epitaxy Technology, Inc. (United States)
J. W. Devitt, L-3 Communications Cincinnati Electronics (United States)


Published in SPIE Proceedings Vol. 7298:
Infrared Technology and Applications XXXV
Bjørn F. Andresen; Gabor F. Fulop; Paul R. Norton, Editor(s)

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