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Proceedings Paper

Noise characteristics and reliability of high power white light emitting diodes based on nitrides
Author(s): J. Matukas; V. Palenskis; J. Vyšniauskas; B. Šaulys; S. Pralgauskaitė; A. Pincevičius
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Paper Abstract

High power white light emission diode reliability and aging processes have been investigated. Optical, electrical and noise characteristics have been carried out for initial devices and during their aging. Analysis of noise characteristics help revealing of light emission diode aging processes and reliability problems. It is found that optical and electrical noise spectra changes reflect light emission diode aging. Noise characteristics, especially correlation factor between optical and electrical fluctuations, and current-voltage characteristics at low bias reveal physical processes that take place during investigated device aging and rapid its degradation. It is shown that reason of high power light emission diode degradation is related with defects presence in the device structure. Additional defects appear during LED operation and lead to the leakage current and non-radiative recombination increase.

Paper Details

Date Published: 2 December 2008
PDF: 6 pages
Proc. SPIE 7142, Sixth International Conference on Advanced Optical Materials and Devices (AOMD-6), 71420H (2 December 2008); doi: 10.1117/12.816513
Show Author Affiliations
J. Matukas, Vilnius Univ. (Lithuania)
V. Palenskis, Vilnius Univ. (Lithuania)
J. Vyšniauskas, Vilnius Univ. (Lithuania)
B. Šaulys, Vilnius Univ. (Lithuania)
S. Pralgauskaitė, Vilnius Univ. (Lithuania)
A. Pincevičius, Vilnius Univ. (Lithuania)


Published in SPIE Proceedings Vol. 7142:
Sixth International Conference on Advanced Optical Materials and Devices (AOMD-6)
Janis Spigulis; Andris Krumins; Donats Millers; Andris Sternberg; Inta Muzikante; Andris Ozols; Maris Ozolinsh, Editor(s)

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