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Proceedings Paper

Support technologies involved in the development and implementation of radiometric systems for sensor calibration, characterization, and HWIL testing at AEDC
Author(s): H. S. Lowry; M. F. Breeden; D. H. Crider; S. L. Steely; R. A. Nicholson; J. M. Labello
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Paper Abstract

The characterization, calibration, and mission simulation testing of space-based, interceptor, and air-borne sensors require a continual involvement in the development and evaluation of radiometric projection technologies. Activities at Arnold Engineering Development Center (AEDC) include Hardware in the Loop (HWIL) testing with high-fidelity complex scene-projection technologies as well as improvements in the radiometric source-calibration systems. These technologies are integrated into a low cryo-vacuum (~20 K) environment. The latest scene simulation and HWIL projection technologies are being investigated that can produce desired target temperatures and target-to-sensor ranges such that sensor mission performance can be evaluated. These technologies include multiple-band source subsystems and special spectral-tailoring methods, as well as comprehensive analysis and optical properties measurements of the components involved. Emphasis areas include the development of methodologies to test wide field of view (WFOV), polarimetric, and multi/hyperspectral radiometric imaging systems.

Paper Details

Date Published: 22 April 2009
PDF: 12 pages
Proc. SPIE 7301, Technologies for Synthetic Environments: Hardware-in-the-Loop Testing XIV, 730105 (22 April 2009); doi: 10.1117/12.816107
Show Author Affiliations
H. S. Lowry, Arnold Air Force Base (United States)
M. F. Breeden, Arnold Air Force Base (United States)
D. H. Crider, Arnold Air Force Base (United States)
S. L. Steely, Arnold Air Force Base (United States)
R. A. Nicholson, Arnold Air Force Base (United States)
J. M. Labello, Arnold Air Force Base (United States)


Published in SPIE Proceedings Vol. 7301:
Technologies for Synthetic Environments: Hardware-in-the-Loop Testing XIV
James A. Buford; Robert Lee Murrer, Editor(s)

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